test: dm: add sandbox PMIC framework tests
This change adds new file to sandbox driver model test environment.
The file is: test/dm/power.c, and it includes tests for PMIC framework,
which includes PMIC uclass and REGULATOR uclass.
All tests are based od Sandbox PMIC emulated device. Some test constants for
this device are defined in the header: include/power/sandbox_pmic.h
PMIC tests includes:
- pmic get - tests, that pmic_get() returns the requested device
- pmic I/O - tests I/O by writing and reading some values to PMIC's registers
and then compares, that the write/read values are equal.
The regulator tests includes:
- Regulator get by devname/platname
- Voltage set/get
- Current set/get
- Enable set/get
- Mode set/get
- Autoset
- List autoset
For the regulator 'get' test, the returned device pointers are compared,
and their names are also compared to the requested one.
Every other test, first sets the given attribute and next try to get it.
The test pass, when the set/get values are equal.
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Acked-by: Simon Glass <sjg@chromium.org>
Tested on sandbox:
Tested-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Przemyslaw Marczak
Simon Glass
parent
5d387d0df9
commit
e8f339e0e8
@ -102,4 +102,37 @@ enum {
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/* Operation mode id -> register value conversion */
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#define OM2REG(x) (x)
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/* Test data for: test/dm/power.c */
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/* BUCK names */
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#define SANDBOX_BUCK1_DEVNAME "buck1"
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#define SANDBOX_BUCK1_PLATNAME "SUPPLY_1.2V"
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#define SANDBOX_BUCK2_DEVNAME "buck2"
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#define SANDBOX_BUCK2_PLATNAME "SUPPLY_3.3V"
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/* LDO names */
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#define SANDBOX_LDO1_DEVNAME "ldo1"
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#define SANDBOX_LDO1_PLATNAME "VDD_EMMC_1.8V"
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#define SANDBOX_LDO2_DEVNAME "ldo2"
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#define SANDBOX_LDO2_PLATNAME "VDD_LCD_3.3V"
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/*
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* Expected regulators setup after call of:
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* - regulator_autoset()
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* - regulator_list_autoset()
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*/
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/* BUCK1: for testing regulator_autoset() */
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#define SANDBOX_BUCK1_AUTOSET_EXPECTED_UV 1200000
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#define SANDBOX_BUCK1_AUTOSET_EXPECTED_UA 200000
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#define SANDBOX_BUCK1_AUTOSET_EXPECTED_ENABLE true
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/* LDO1/2 for testing regulator_list_autoset() */
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#define SANDBOX_LDO1_AUTOSET_EXPECTED_UV 1800000
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#define SANDBOX_LDO1_AUTOSET_EXPECTED_UA 100000
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#define SANDBOX_LDO1_AUTOSET_EXPECTED_ENABLE true
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#define SANDBOX_LDO2_AUTOSET_EXPECTED_UV 3000000
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#define SANDBOX_LDO2_AUTOSET_EXPECTED_UA -ENOSYS
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#define SANDBOX_LDO2_AUTOSET_EXPECTED_ENABLE false
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#endif
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@ -25,4 +25,6 @@ obj-$(CONFIG_DM_RTC) += rtc.o
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obj-$(CONFIG_DM_SPI_FLASH) += sf.o
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obj-$(CONFIG_DM_SPI) += spi.o
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obj-$(CONFIG_DM_USB) += usb.o
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obj-$(CONFIG_DM_PMIC) += pmic.o
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obj-$(CONFIG_DM_REGULATOR) += regulator.o
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endif
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69
test/dm/pmic.c
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69
test/dm/pmic.c
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@ -0,0 +1,69 @@
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/*
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* Tests for the driver model pmic API
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*
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* Copyright (c) 2015 Samsung Electronics
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* Przemyslaw Marczak <p.marczak@samsung.com>
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*
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* SPDX-License-Identifier: GPL-2.0+
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*/
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#include <common.h>
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#include <errno.h>
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#include <dm.h>
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#include <fdtdec.h>
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#include <malloc.h>
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#include <dm/device-internal.h>
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#include <dm/root.h>
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#include <dm/ut.h>
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#include <dm/util.h>
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#include <dm/test.h>
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#include <dm/uclass-internal.h>
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#include <power/pmic.h>
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#include <power/sandbox_pmic.h>
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DECLARE_GLOBAL_DATA_PTR;
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/* Test PMIC get method */
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static int dm_test_power_pmic_get(struct dm_test_state *dms)
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{
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const char *name = "sandbox_pmic";
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struct udevice *dev;
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ut_assertok(pmic_get(name, &dev));
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ut_assertnonnull(dev);
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/* Check PMIC's name */
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ut_asserteq_str(name, dev->name);
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return 0;
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}
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DM_TEST(dm_test_power_pmic_get, DM_TESTF_SCAN_FDT);
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/* Test PMIC I/O */
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static int dm_test_power_pmic_io(struct dm_test_state *dms)
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{
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const char *name = "sandbox_pmic";
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uint8_t out_buffer, in_buffer;
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struct udevice *dev;
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int reg_count, i;
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ut_assertok(pmic_get(name, &dev));
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reg_count = pmic_reg_count(dev);
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ut_asserteq(reg_count, SANDBOX_PMIC_REG_COUNT);
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/*
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* Test PMIC I/O - write and read a loop counter.
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* usually we can't write to all PMIC's registers in the real hardware,
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* but we can to the sandbox pmic.
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*/
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for (i = 0; i < reg_count; i++) {
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out_buffer = i;
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ut_assertok(pmic_write(dev, i, &out_buffer, 1));
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ut_assertok(pmic_read(dev, i, &in_buffer, 1));
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ut_asserteq(out_buffer, in_buffer);
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}
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return 0;
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}
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DM_TEST(dm_test_power_pmic_io, DM_TESTF_SCAN_FDT);
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325
test/dm/regulator.c
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325
test/dm/regulator.c
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@ -0,0 +1,325 @@
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/*
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* Tests for the driver model regulator API
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*
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* Copyright (c) 2015 Samsung Electronics
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* Przemyslaw Marczak <p.marczak@samsung.com>
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*
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* SPDX-License-Identifier: GPL-2.0+
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*/
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#include <common.h>
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#include <errno.h>
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#include <dm.h>
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#include <fdtdec.h>
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#include <malloc.h>
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#include <dm/device-internal.h>
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#include <dm/root.h>
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#include <dm/ut.h>
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#include <dm/util.h>
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#include <dm/test.h>
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#include <dm/uclass-internal.h>
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#include <power/pmic.h>
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#include <power/regulator.h>
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#include <power/sandbox_pmic.h>
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DECLARE_GLOBAL_DATA_PTR;
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enum {
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BUCK1,
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BUCK2,
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LDO1,
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LDO2,
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OUTPUT_COUNT,
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};
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enum {
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DEVNAME = 0,
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PLATNAME,
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OUTPUT_NAME_COUNT,
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};
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static const char *regulator_names[OUTPUT_COUNT][OUTPUT_NAME_COUNT] = {
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/* devname, platname */
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{ SANDBOX_BUCK1_DEVNAME, SANDBOX_BUCK1_PLATNAME },
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{ SANDBOX_BUCK2_DEVNAME, SANDBOX_BUCK2_PLATNAME },
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{ SANDBOX_LDO1_DEVNAME, SANDBOX_LDO1_PLATNAME},
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{ SANDBOX_LDO2_DEVNAME, SANDBOX_LDO2_PLATNAME},
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};
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/* Test regulator get method */
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static int dm_test_power_regulator_get(struct dm_test_state *dms)
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{
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struct dm_regulator_uclass_platdata *uc_pdata;
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struct udevice *dev_by_devname;
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struct udevice *dev_by_platname;
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const char *devname;
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const char *platname;
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int i;
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for (i = 0; i < OUTPUT_COUNT; i++) {
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/*
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* Do the test for each regulator's devname and platname,
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* which are related to a single device.
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*/
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devname = regulator_names[i][DEVNAME];
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platname = regulator_names[i][PLATNAME];
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/*
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* Check, that regulator_get_by_devname() function, returns
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* a device with the name equal to the requested one.
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*/
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ut_assertok(regulator_get_by_devname(devname, &dev_by_devname));
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ut_asserteq_str(devname, dev_by_devname->name);
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/*
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* Check, that regulator_get_by_platname() function, returns
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* a device with the name equal to the requested one.
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*/
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ut_assertok(regulator_get_by_platname(platname, &dev_by_platname));
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uc_pdata = dev_get_uclass_platdata(dev_by_platname);
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ut_assert(uc_pdata);
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ut_asserteq_str(platname, uc_pdata->name);
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/*
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* Check, that the pointers returned by both get functions,
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* points to the same regulator device.
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*/
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ut_asserteq_ptr(dev_by_devname, dev_by_platname);
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}
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return 0;
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}
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DM_TEST(dm_test_power_regulator_get, DM_TESTF_SCAN_FDT);
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/* Test regulator set and get Voltage method */
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static int dm_test_power_regulator_set_get_voltage(struct dm_test_state *dms)
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{
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struct dm_regulator_uclass_platdata *uc_pdata;
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struct udevice *dev;
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const char *platname;
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int val_set, val_get;
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/* Set and get Voltage of BUCK1 - set to 'min' constraint */
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platname = regulator_names[BUCK1][PLATNAME];
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ut_assertok(regulator_get_by_platname(platname, &dev));
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uc_pdata = dev_get_uclass_platdata(dev);
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ut_assert(uc_pdata);
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val_set = uc_pdata->min_uV;
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ut_assertok(regulator_set_value(dev, val_set));
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val_get = regulator_get_value(dev);
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ut_assert(val_get >= 0);
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ut_asserteq(val_set, val_get);
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return 0;
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}
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DM_TEST(dm_test_power_regulator_set_get_voltage, DM_TESTF_SCAN_FDT);
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/* Test regulator set and get Current method */
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static int dm_test_power_regulator_set_get_current(struct dm_test_state *dms)
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{
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struct dm_regulator_uclass_platdata *uc_pdata;
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struct udevice *dev;
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const char *platname;
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int val_set, val_get;
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/* Set and get the Current of LDO1 - set to 'min' constraint */
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platname = regulator_names[LDO1][PLATNAME];
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ut_assertok(regulator_get_by_platname(platname, &dev));
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uc_pdata = dev_get_uclass_platdata(dev);
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ut_assert(uc_pdata);
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val_set = uc_pdata->min_uA;
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ut_assertok(regulator_set_current(dev, val_set));
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val_get = regulator_get_current(dev);
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ut_assert(val_get >= 0);
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ut_asserteq(val_set, val_get);
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/* Check LDO2 current limit constraints - should be -ENODATA */
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platname = regulator_names[LDO2][PLATNAME];
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ut_assertok(regulator_get_by_platname(platname, &dev));
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uc_pdata = dev_get_uclass_platdata(dev);
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ut_assert(uc_pdata);
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ut_asserteq(-ENODATA, uc_pdata->min_uA);
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ut_asserteq(-ENODATA, uc_pdata->max_uA);
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/* Try set the Current of LDO2 - should return -ENOSYS */
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ut_asserteq(-ENOSYS, regulator_set_current(dev, 0));
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return 0;
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}
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DM_TEST(dm_test_power_regulator_set_get_current, DM_TESTF_SCAN_FDT);
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/* Test regulator set and get Enable method */
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static int dm_test_power_regulator_set_get_enable(struct dm_test_state *dms)
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{
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const char *platname;
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struct udevice *dev;
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bool val_set = true;
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/* Set the Enable of LDO1 - default is disabled */
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platname = regulator_names[LDO1][PLATNAME];
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ut_assertok(regulator_get_by_platname(platname, &dev));
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ut_assertok(regulator_set_enable(dev, val_set));
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/* Get the Enable state of LDO1 and compare it with the requested one */
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ut_asserteq(regulator_get_enable(dev), val_set);
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return 0;
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}
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DM_TEST(dm_test_power_regulator_set_get_enable, DM_TESTF_SCAN_FDT);
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/* Test regulator set and get mode method */
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static int dm_test_power_regulator_set_get_mode(struct dm_test_state *dms)
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{
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const char *platname;
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struct udevice *dev;
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int val_set = LDO_OM_SLEEP;
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/* Set the mode id to LDO_OM_SLEEP of LDO1 - default is LDO_OM_OFF */
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platname = regulator_names[LDO1][PLATNAME];
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ut_assertok(regulator_get_by_platname(platname, &dev));
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ut_assertok(regulator_set_mode(dev, val_set));
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/* Get the mode id of LDO1 and compare it with the requested one */
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ut_asserteq(regulator_get_mode(dev), val_set);
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return 0;
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}
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DM_TEST(dm_test_power_regulator_set_get_mode, DM_TESTF_SCAN_FDT);
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/* Test regulator autoset method */
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static int dm_test_power_regulator_autoset(struct dm_test_state *dms)
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{
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const char *platname;
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struct udevice *dev, *dev_autoset;
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/*
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* Test the BUCK1 with fdt properties
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* - min-microvolt = max-microvolt = 1200000
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* - min-microamp = max-microamp = 200000
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* - always-on = set
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* - boot-on = not set
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* Expected output state: uV=1200000; uA=200000; output enabled
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*/
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platname = regulator_names[BUCK1][PLATNAME];
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ut_assertok(regulator_autoset(platname, &dev_autoset, false));
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/* Check, that the returned device is proper */
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ut_assertok(regulator_get_by_platname(platname, &dev));
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ut_asserteq_ptr(dev, dev_autoset);
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/* Check the setup after autoset */
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ut_asserteq(regulator_get_value(dev),
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SANDBOX_BUCK1_AUTOSET_EXPECTED_UV);
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ut_asserteq(regulator_get_current(dev),
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SANDBOX_BUCK1_AUTOSET_EXPECTED_UA);
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ut_asserteq(regulator_get_enable(dev),
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SANDBOX_BUCK1_AUTOSET_EXPECTED_ENABLE);
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return 0;
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}
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DM_TEST(dm_test_power_regulator_autoset, DM_TESTF_SCAN_FDT);
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/*
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* Struct setting: to keep the expected output settings.
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* @voltage: Voltage value [uV]
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* @current: Current value [uA]
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* @enable: output enable state: true/false
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*/
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struct setting {
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int voltage;
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int current;
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bool enable;
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};
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/*
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* platname_list: an array of regulator platform names.
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* For testing regulator_list_autoset() for outputs:
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* - LDO1
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* - LDO2
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*/
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static const char *platname_list[] = {
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SANDBOX_LDO1_PLATNAME,
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SANDBOX_LDO2_PLATNAME,
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NULL,
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};
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/*
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* expected_setting_list: an array of regulator output setting, expected after
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* call of the regulator_list_autoset() for the "platname_list" array.
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* For testing results of regulator_list_autoset() for outputs:
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* - LDO1
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* - LDO2
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* The settings are defined in: include/power/sandbox_pmic.h
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*/
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static const struct setting expected_setting_list[] = {
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[0] = { /* LDO1 */
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.voltage = SANDBOX_LDO1_AUTOSET_EXPECTED_UV,
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.current = SANDBOX_LDO1_AUTOSET_EXPECTED_UA,
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.enable = SANDBOX_LDO1_AUTOSET_EXPECTED_ENABLE,
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},
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[1] = { /* LDO2 */
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.voltage = SANDBOX_LDO2_AUTOSET_EXPECTED_UV,
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.current = SANDBOX_LDO2_AUTOSET_EXPECTED_UA,
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.enable = SANDBOX_LDO2_AUTOSET_EXPECTED_ENABLE,
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},
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};
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static int list_count = ARRAY_SIZE(expected_setting_list);
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/* Test regulator list autoset method */
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static int dm_test_power_regulator_autoset_list(struct dm_test_state *dms)
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{
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struct udevice *dev_list[2], *dev;
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int i;
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/*
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* Test the settings of the regulator list:
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* LDO1 with fdt properties:
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* - min-microvolt = max-microvolt = 1800000
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* - min-microamp = max-microamp = 100000
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* - always-on = not set
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* - boot-on = set
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* Expected output state: uV=1800000; uA=100000; output enabled
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*
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* LDO2 with fdt properties:
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* - min-microvolt = max-microvolt = 3300000
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* - always-on = not set
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* - boot-on = not set
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* Expected output state: uV=300000(default); output disabled(default)
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* The expected settings are defined in: include/power/sandbox_pmic.h.
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*/
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ut_assertok(regulator_list_autoset(platname_list, dev_list, false));
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|
||||
for (i = 0; i < list_count; i++) {
|
||||
/* Check, that the returned device is non-NULL */
|
||||
ut_assert(dev_list[i]);
|
||||
|
||||
/* Check, that the returned device is proper */
|
||||
ut_assertok(regulator_get_by_platname(platname_list[i], &dev));
|
||||
ut_asserteq_ptr(dev_list[i], dev);
|
||||
|
||||
/* Check, that regulator output Voltage value is as expected */
|
||||
ut_asserteq(regulator_get_value(dev_list[i]),
|
||||
expected_setting_list[i].voltage);
|
||||
|
||||
/* Check, that regulator output Current value is as expected */
|
||||
ut_asserteq(regulator_get_current(dev_list[i]),
|
||||
expected_setting_list[i].current);
|
||||
|
||||
/* Check, that regulator output Enable state is as expected */
|
||||
ut_asserteq(regulator_get_enable(dev_list[i]),
|
||||
expected_setting_list[i].enable);
|
||||
}
|
||||
|
||||
return 0;
|
||||
}
|
||||
DM_TEST(dm_test_power_regulator_autoset_list, DM_TESTF_SCAN_FDT);
|
||||
Loading…
Reference in New Issue
Block a user