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thermal: exynos: Provide initial setting for TMU's test MUX address at Exynos4412

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The commit d0a0ce3e77 ("thermal: exynos: Add
missing definations and code cleanup") has removed setting of test MUX address
value at TMU configuration setting.

This field is not present on Exynos4210 and Exynos5 SoCs. However on Exynos4412
SoC it is required to set this field after reset because without it TMU shows
maximal available temperature, which causes immediate platform shutdown.

Signed-off-by: Lukasz Majewski <l.majewski@samsung.com>
Reviewed-by: Bartlomiej Zolnierkiewicz <b.zolnierkie@samsung.com>
Reviewed-by: Tomasz Figa <t.figa@samsung.com>
Signed-off-by: Eduardo Valentin <eduardo.valentin@ti.com>
This commit is contained in:
Lukasz Majewski 2013-10-09 08:29:52 +02:00 committed by Eduardo Valentin
parent 14ddfaecc8
commit 86f5362e7a
4 changed files with 13 additions and 0 deletions
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3
drivers/thermal/samsung/exynos_tmu.c
View File

@ -317,6 +317,9 @@ static void exynos_tmu_control(struct platform_device *pdev, bool on)
con = readl(data->base + reg->tmu_ctrl);
if (pdata->test_mux)
con |= (pdata->test_mux << reg->test_mux_addr_shift);
if (pdata->reference_voltage) {
con &= ~(reg->buf_vref_sel_mask << reg->buf_vref_sel_shift);
con |= pdata->reference_voltage << reg->buf_vref_sel_shift;

4
drivers/thermal/samsung/exynos_tmu.h
View File

@ -85,6 +85,7 @@ enum soc_type {
* @triminfo_reload_shift: shift of triminfo reload enable bit in triminfo_ctrl
reg.
* @tmu_ctrl: TMU main controller register.
* @test_mux_addr_shift: shift bits of test mux address.
* @buf_vref_sel_shift: shift bits of reference voltage in tmu_ctrl register.
* @buf_vref_sel_mask: mask bits of reference voltage in tmu_ctrl register.
* @therm_trip_mode_shift: shift bits of tripping mode in tmu_ctrl register.
@ -151,6 +152,7 @@ struct exynos_tmu_registers {
u32 triminfo_reload_shift;
u32 tmu_ctrl;
u32 test_mux_addr_shift;
u32 buf_vref_sel_shift;
u32 buf_vref_sel_mask;
u32 therm_trip_mode_shift;
@ -258,6 +260,7 @@ struct exynos_tmu_registers {
* @first_point_trim: temp value of the first point trimming
* @second_point_trim: temp value of the second point trimming
* @default_temp_offset: default temperature offset in case of no trimming
* @test_mux; information if SoC supports test MUX
* @cal_type: calibration type for temperature
* @cal_mode: calibration mode for temperature
* @freq_clip_table: Table representing frequency reduction percentage.
@ -287,6 +290,7 @@ struct exynos_tmu_platform_data {
u8 first_point_trim;
u8 second_point_trim;
u8 default_temp_offset;
u8 test_mux;
enum calibration_type cal_type;
enum calibration_mode cal_mode;

2
drivers/thermal/samsung/exynos_tmu_data.c
View File

@ -98,6 +98,7 @@ static const struct exynos_tmu_registers exynos4412_tmu_registers = {
.triminfo_ctrl = EXYNOS_TMU_TRIMINFO_CON,
.triminfo_reload_shift = EXYNOS_TRIMINFO_RELOAD_SHIFT,
.tmu_ctrl = EXYNOS_TMU_REG_CONTROL,
.test_mux_addr_shift = EXYNOS4412_MUX_ADDR_SHIFT,
.buf_vref_sel_shift = EXYNOS_TMU_REF_VOLTAGE_SHIFT,
.buf_vref_sel_mask = EXYNOS_TMU_REF_VOLTAGE_MASK,
.therm_trip_mode_shift = EXYNOS_TMU_TRIP_MODE_SHIFT,
@ -174,6 +175,7 @@ struct exynos_tmu_init_data const exynos4412_default_tmu_data = {
{
EXYNOS4412_TMU_DATA,
.type = SOC_ARCH_EXYNOS4412,
.test_mux = EXYNOS4412_MUX_ADDR_VALUE,
},
},
.tmu_count = 1,

4
drivers/thermal/samsung/exynos_tmu_data.h
View File

@ -95,6 +95,10 @@
#define EXYNOS_MAX_TRIGGER_PER_REG 4
/* Exynos4412 specific */
#define EXYNOS4412_MUX_ADDR_VALUE 6
#define EXYNOS4412_MUX_ADDR_SHIFT 20
/*exynos5440 specific registers*/
#define EXYNOS5440_TMU_S0_7_TRIM 0x000
#define EXYNOS5440_TMU_S0_7_CTRL 0x020