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5314b15437
Currently, each trip point defined in the device tree corresponds to a single hardware interrupt. This commit instead switches to using two hardware interrupts, whose values are set dynamically using the set_trips callback. Additionally, the critical temperature threshold is handled specifically. Setting interrupts in this way also fixes a long-standing lockdep warning, which was caused by calling thermal_zone_get_trips with our lock being held. Do note that this requires TMU initialization to be split into two parts, as done by the parent commit: parts of the initialization call into the thermal_zone_device structure and so must be done after its registration, but the initialization is also responsible for setting up calibration, which must be done before thermal_zone_device registration, which will call set_trips for the first time; if the calibration is not done in time, the interrupt values will be silently wrong! Reviewed-by: Lukasz Luba <lukasz.luba@arm.com> Signed-off-by: Mateusz Majewski <m.majewski2@samsung.com> Signed-off-by: Daniel Lezcano <daniel.lezcano@linaro.org> Link: https://lore.kernel.org/r/20231201095625.301884-10-m.majewski2@samsung.com |
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| exynos_tmu.c | ||
| Kconfig | ||
| Makefile | ||