pwm: samsung: Fix a bit test in pwm_samsung_resume()

The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
used as in a bitwise AND.  In this specific code the flag will never be
set so the function is effectively a no-op.

Fixes: e3fe982b2e ("pwm: samsung: Put per-channel data into driver data")
Signed-off-by: Dan Carpenter <dan.carpenter@linaro.org>
Reviewed-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de>
Reviewed-by: Sam Protsenko <semen.protsenko@linaro.org>
Signed-off-by: Thierry Reding <thierry.reding@gmail.com>
This commit is contained in:
Dan Carpenter 2023-10-25 14:57:34 +03:00 committed by Thierry Reding
parent 40592064a1
commit a2da597ff6

View File

@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev)
struct pwm_device *pwm = &chip->pwms[i];
struct samsung_pwm_channel *chan = &our_chip->channel[i];
if (!(pwm->flags & PWMF_REQUESTED))
if (!test_bit(PWMF_REQUESTED, &pwm->flags))
continue;
if (our_chip->variant.output_mask & BIT(i))